Gabriele Chiodini's BTeV Beam Test Pages (BTeV password protected)
Photographs of CiS ST-1 showing doubly connected pixels
FPIX0 Scope pictures (Illustrating timing requirements and mistakes which can be made)
FPIX0 Initialization and Readout (DCC)
FPIX0 Readout Timing (using FPRB0 outer board) (Guilherme Cardoso 3/12/99) PDF file of the same thing.
"FPIX0 Readout Controller" by Gustavo Cancelo, Sergio Zimmermann, and Guilherme Cardoso (draft dated March 12, 1999)
Calibration of FPRB0#1 ADC for cell (11,0) Postscript file of the same plot.
Here are I-V curves for two Seiko sensors, one pstop (ST-1) & one pspray (ST-2). Both sensors are mounted on inner boards & bonded to FPIX1's. For both sets of measurements, the n-side guard ring was floating.
Click here for a postscript version of the plot.
Click here for a postscript version of the plot.
Here are I-V curves for the two CiS sensors (mounted on inner boards & bonded to FPIX0's). The n-implant guard ring is connected to 0.6V. Before the sensor is fully depleted, current flows between the n-pixel implants and the guard ring.
Click here for a postscript version of the plot.
Click here for a postscript version of the plot.
For a period of time in August and early September, 1999, the bias current drawn by this sensor increased by about a factor of ten. We have no idea why. Click here to see the IV curve recorded on 8/27/99 (postscript)
Initial source tests (Sr-90) have been done for both the CiS ST-1 & ST-2 sensors. All bump bonds & FPIX0 channels are okay on the ST-2 (p-spray) sensor (More later on why FPIX0 rows 60-63 are not connected). The ST-1 has ~6 dead channels (probably bad bumps) & 1 noisy channel.
I-V and C-V curves are shown below for one of the silicon strip sensors which will be used in the beam telescope. The depletion voltage is ~30V, as can be seen from the C-V curve. The I-V curve does not have an obvious plateau starting at the depletion voltage.
Click here for a postscript version of the plot.
Seiko ST2 (p-spray) sensor bonded to FPIX0 destroyed.
